GB/T 34479-2017

Active

Specification for alphanumeric marking of silicon wafers

硅片字母数字标志规范

Standard Type
GBT
ICS
29.045
CCS
H80
Status
Active
Issue Date
2017-10-14
Implementation
2018-07-01
Centralized Committee
国家标准委
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the format, size, and placement of alphanumeric markings on silicon wafers used in semiconductor manufacturing. It is applied to ensure traceability and identification of wafers during production, testing, and handling in the electronics industry. The standard is particularly relevant for wafer suppliers and fabrication facilities to maintain consistent labeling across different manufacturing stages.

Related Standards

GB/T 12964-2003 Monocrystalline silicon polished wafers GB/T 16596-1996 Specification for establishing a wafer coordinatesystem GB/T 16595-1996 Specification for a universal wafer grid GB/T 12965-2005 Monocrystalline silicon as cut slices and lapped slices GB/T 20230-2006 Indium phosphide single crystal GB/T 20229-2006 Gallium phosphide single crystal GB/T 20228-2006 Gallium arsenide single crystal GB/T 11071-2006 Zone-refined germanium ingot
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.