GB/T 20230-2006
AbolishedIndium phosphide single crystal
磷化铟单晶
Application Summary AI generated
GB/T 20230-2006 specifies the technical requirements, test methods, inspection rules, and packaging for indium phosphide single crystals. It is applied in the semiconductor industry for manufacturing substrates used in high-frequency electronic devices, optoelectronic components like laser diodes and photodetectors, and integrated circuits operating in the microwave and millimeter-wave frequency ranges. The standard ensures material quality and consistency for R&D and production environments requiring precise crystalline properties.
Related Standards
GB/T 12964-2003
Monocrystalline silicon polished wafers
GB/T 16596-1996
Specification for establishing a wafer coordinatesystem
GB/T 16595-1996
Specification for a universal wafer grid
GB/T 12965-2005
Monocrystalline silicon as cut slices and lapped slices
GB/T 20229-2006
Gallium phosphide single crystal
GB/T 20228-2006
Gallium arsenide single crystal
GB/T 11071-2006
Zone-refined germanium ingot
GB/T 11070-2006
Reduced germanium ingot
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.