GB/T 11071-2006
AbolishedZone-refined germanium ingot
区熔锗锭
Application Summary AI generated
GB/T 11071-2006 specifies the technical requirements, test methods, inspection rules, and packaging for zone-refined germanium ingots used as raw material in semiconductor manufacturing. It applies to the production and quality control of high-purity germanium ingots (typically 99.9999% or higher purity) intended for infrared optics, radiation detectors, and electronic substrates. The standard is critical for ensuring consistent electrical and crystalline properties in devices like high-efficiency solar cells and gamma-ray spectrometers.
Related Standards
GB/T 12964-2003
Monocrystalline silicon polished wafers
GB/T 16596-1996
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GB/T 16595-1996
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GB/T 12965-2005
Monocrystalline silicon as cut slices and lapped slices
GB/T 20230-2006
Indium phosphide single crystal
GB/T 20229-2006
Gallium phosphide single crystal
GB/T 20228-2006
Gallium arsenide single crystal
GB/T 11070-2006
Reduced germanium ingot
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.