GB/T 31092-2014

Abolished

Monocrystalline sapphire ingot

蓝宝石单晶晶锭

Standard Type

GBT

ICS

29.045

CCS

H83

Status

Abolished

Issue Date

2014-12-22

Implementation

2015-09-01

Centralized Committee

国家标准委

Issuing Authority

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

GB/T 31092-2014 specifies the technical requirements, test methods, inspection rules, and packaging for monocrystalline sapphire ingots used as substrate material in semiconductor and optoelectronic industries. It applies to the production and quality control of sapphire ingots intended for manufacturing LED chips, optical windows, and high-temperature electronic components. The standard ensures consistency in crystal orientation, defect density, and dimensional tolerances for downstream wafer processing.

Related Standards

GB/T 12964-2003 Monocrystalline silicon polished wafers GB/T 16596-1996 Specification for establishing a wafer coordinatesystem GB/T 16595-1996 Specification for a universal wafer grid GB/T 12965-2005 Monocrystalline silicon as cut slices and lapped slices GB/T 20230-2006 Indium phosphide single crystal GB/T 20229-2006 Gallium phosphide single crystal GB/T 20228-2006 Gallium arsenide single crystal GB/T 11071-2006 Zone-refined germanium ingot

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.