GB/T 30453-2013

Active

Metallographs collection for original defects of crystalline silicon

硅材料原生缺陷图谱

Standard Type

GBT

ICS

29.045

CCS

H80

Status

Active

Issue Date

2013-12-31

Implementation

2014-10-01

Centralized Committee

国家标准委

Issuing Authority

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

GB/T 30453-2013 provides a standardized visual reference of metallographic images documenting original defects in crystalline silicon materials. It is applied in the semiconductor and photovoltaic industries for quality inspection and defect identification during silicon wafer manufacturing. The standard aids engineers in classifying and comparing defects like dislocations, stacking faults, and precipitates to ensure material purity and device performance.

Related Standards

GB/T 12964-2003 Monocrystalline silicon polished wafers GB/T 16596-1996 Specification for establishing a wafer coordinatesystem GB/T 16595-1996 Specification for a universal wafer grid GB/T 12965-2005 Monocrystalline silicon as cut slices and lapped slices GB/T 20230-2006 Indium phosphide single crystal GB/T 20229-2006 Gallium phosphide single crystal GB/T 20228-2006 Gallium arsenide single crystal GB/T 11071-2006 Zone-refined germanium ingot

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.