GB/T 29055-2012
AbolishedMulti-crystalline silicon wafer for solar cell
太阳电池用多晶硅片
Application Summary AI generated
This standard specifies the technical requirements, test methods, inspection rules, and marking, packaging, transportation, and storage conditions for multi-crystalline silicon wafers used in solar cells. It is applied in the photovoltaic industry for manufacturing terrestrial solar cells, ensuring wafer quality in terms of dimensions, resistivity, minority carrier lifetime, and defect density. The standard is used by silicon wafer producers and solar cell manufacturers for quality control and acceptance testing during production and procurement.
Related Standards
GB/T 12964-2003
Monocrystalline silicon polished wafers
GB/T 16596-1996
Specification for establishing a wafer coordinatesystem
GB/T 16595-1996
Specification for a universal wafer grid
GB/T 12965-2005
Monocrystalline silicon as cut slices and lapped slices
GB/T 20230-2006
Indium phosphide single crystal
GB/T 20229-2006
Gallium phosphide single crystal
GB/T 20228-2006
Gallium arsenide single crystal
GB/T 11071-2006
Zone-refined germanium ingot
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.