GB/T 26071-2010
AbolishedMono-crystalline silicon as cut slices for photovoltaic solar cells
太阳能电池用硅单晶切割片
Application Summary AI generated
GB/T 26071-2010 specifies the technical requirements, test methods, inspection rules, and packaging for mono-crystalline silicon slices used in photovoltaic solar cells. It applies to the production and quality control of silicon wafers cut from single-crystal ingots, ensuring dimensional accuracy, resistivity, and surface quality for solar cell manufacturing. This standard is used by silicon wafer producers and solar cell manufacturers in China to guarantee consistency and performance in photovoltaic module assembly.
Related Standards
GB/T 12964-2003
Monocrystalline silicon polished wafers
GB/T 16596-1996
Specification for establishing a wafer coordinatesystem
GB/T 16595-1996
Specification for a universal wafer grid
GB/T 12965-2005
Monocrystalline silicon as cut slices and lapped slices
GB/T 20230-2006
Indium phosphide single crystal
GB/T 20229-2006
Gallium phosphide single crystal
GB/T 20228-2006
Gallium arsenide single crystal
GB/T 11071-2006
Zone-refined germanium ingot
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.