GB/T 11070-2006

Abolished

Reduced germanium ingot

还原锗锭

Standard Type

GBT

ICS

29.045

CCS

H82

Status

Abolished

Issue Date

2006-07-18

Implementation

2006-11-01

Centralized Committee

中国有色金属工业协会

Issuing Authority

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

GB/T 11070-2006 specifies the technical requirements, test methods, inspection rules, and packaging for reduced germanium ingots. It is applied in the semiconductor and electronics industries as a material standard for producing high-purity germanium used in infrared optics, radiation detectors, and fiber optics. The standard ensures consistent quality for ingots intended for further processing into single-crystal germanium or other electronic-grade germanium products.

Related Standards

GB/T 12964-2003 Monocrystalline silicon polished wafers GB/T 16596-1996 Specification for establishing a wafer coordinatesystem GB/T 16595-1996 Specification for a universal wafer grid GB/T 12965-2005 Monocrystalline silicon as cut slices and lapped slices GB/T 20230-2006 Indium phosphide single crystal GB/T 20229-2006 Gallium phosphide single crystal GB/T 20228-2006 Gallium arsenide single crystal GB/T 11071-2006 Zone-refined germanium ingot

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.