GB/T 12962-2015

Active

Monocrystalline silicon

硅单晶

Standard Type

GBT

ICS

29.045

CCS

H82

Status

Active

Issue Date

2015-12-10

Implementation

2017-01-01

Centralized Committee

国家标准委

Issuing Authority

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

GB/T 12962-2015 specifies the technical requirements, test methods, inspection rules, and packaging for monocrystalline silicon used in semiconductor manufacturing. It applies to the production and quality control of silicon wafers and ingots for electronic devices such as integrated circuits and solar cells. This standard ensures material consistency and purity for applications in the electronics and photovoltaic industries.

Related Standards

GB/T 12964-2003 Monocrystalline silicon polished wafers GB/T 16596-1996 Specification for establishing a wafer coordinatesystem GB/T 16595-1996 Specification for a universal wafer grid GB/T 12965-2005 Monocrystalline silicon as cut slices and lapped slices GB/T 20230-2006 Indium phosphide single crystal GB/T 20229-2006 Gallium phosphide single crystal GB/T 20228-2006 Gallium arsenide single crystal GB/T 11071-2006 Zone-refined germanium ingot

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.