Browse Standards

1435+ standards in database

1435 result(s) found

GB/T 31370.2-2015 Active

平板显示器(FPD)彩色滤光片测试方法 第2部分:耐光性

Test mothod of flat panel display (FPD) color filters—Part 2: Light resistance

ICS: 31.030
2015-10-01
GB/T 31370.1-2015 Active

平板显示器(FPD)彩色滤光片测试方法 第1部分:颜色和透光率

Test mothod of flat panel display (FPD) color filters—Part 1: Color and transmitance

ICS: 31.030
2015-10-01
GB/T 5593-2015 Active

电子元器件结构陶瓷材料

Structure ceramic materials used in electronic component and device

ICS: 31
2016-01-01
GB/T 31469-2015 Active

半导体材料切削液

Semiconductor materials cutting fluid

ICS: 31
2016-01-01
GB/T 31417-2015 Abolished

等离子显示器用荧光粉

Phosphors for plasma display panel

ICS: 31
2016-01-01
GB/T 16525-2015 Active

半导体集成电路 塑料有引线片式载体封装引线框架规范

Semiconductor integrated circuits—Specification of leadframes for plastic leaded chip carrier package

ICS: 31.200
2016-01-01
GB/T 15878-2015 Active

半导体集成电路 小外形封装引线框架规范

Semiconductor integrated circuits—Specification of leadframes for small outline package

ICS: 31.200
2016-01-01
GB/T 15876-2015 Active

半导体集成电路 塑料四面引线扁平封装引线框架规范

Semiconductor integrated circuits—Specification of leadframes for plastic quad flat package

ICS: 31.200
2016-01-01
GB/T 14112-2015 Active

半导体集成电路 塑料双列封装冲制型引线框架规范

Semiconductor integrated circuits—Specification for stamped leadframes of plastic DIP

ICS: 31.200
2016-01-01
GB/T 5598-2015 Active

氧化铍瓷导热系数测定方法

Test method for thermal conductivity of beryllium oxide ceramics

ICS: 31
2016-01-01
GB/T 5594.8-2015 Active

电子元器件结构陶瓷材料性能测试方法 第8部分:显微结构的测定方法

Test methods for properties of structure ceramic used in electronic components and device—Part 8: Test method for microstructure

ICS: 31
2016-01-01
GB/T 5594.7-2015 Active

电子元器件结构陶瓷材料性能测试方法 第7部分:透液性测定方法

Test methods for properties of structure ceramic used in electronic components and device—Part 7: Test method for liquid permeability

ICS: 31
2016-01-01
GB/T 5594.6-2015 Active

电子元器件结构陶瓷材料性能测试方法 第6部分:化学稳定性测试方法

Test methods for properties of structure ceramics used in eletronic components and device—Part 6: Test method for chemical durability

ICS: 31
2016-01-01
GB/T 5594.4-2015 Active

电子元器件结构陶瓷材料性能测试方法 第4部分:介电常数和介质损耗角正切值的测试方法

Test methods for properties of structure ceramic used in electronic components and device—Part 4: Test method for permittivity and dielectric loss angle tangent value

ICS: 31
2016-01-01
GB/T 5594.3-2015 Active

电子元器件结构陶瓷材料性能测试方法 第3部分:平均线膨胀系数测试方法

Test methods for properties of structure ceramic used in electronic components and device—Part 3: Test method for mean coefficient of linear expansion

ICS: 31
2016-01-01
GB/T 7268-2015 Active

电力系统保护及其自动化装置用插箱及插件面板基本尺寸系列

Series of basic dimensions of subracks and associated plug-in units panels for protection and automation equipment of power system

ICS: 31.240
2015-12-01
GB/T 7267-2015 Active

电力系统二次回路保护及自动化机柜(屏)基本尺寸系列

Series of basic dimension of protective and control panels and cabinet for secondary circuit of power system

ICS: 31.240
2015-12-01
GB/T 5838.45-2015 Active

荧光粉 第4-5部分:彩色显示管用荧光粉

Phosphors—Part 4-5 : Phosphor for color display tubes

ICS: 31
2016-01-01
GB/T 5838.44-2015 Active

荧光粉 第4-4部分:彩色显像管用荧光粉

Phosphors—Part 4-4: Phosphor for color picture tubes

ICS: 31
2016-01-01
GB/T 5838.43-2015 Active

荧光粉 第4-3部分:示波管和显示管用荧光粉

Phosphors—Part 4-3: Phosphor for oscilloscope tubes and display tubes

ICS: 31
2016-01-01
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