GB/T 14112-2015

Active

Semiconductor integrated circuits—Specification for stamped leadframes of plastic DIP

半导体集成电路 塑料双列封装冲制型引线框架规范

Standard Type
GBT
ICS
31.200
CCS
L56
Status
Active
Issue Date
2015-05-15
Implementation
2016-01-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the technical requirements, dimensions, materials, and testing methods for stamped leadframes used in plastic dual in-line package (DIP) semiconductor integrated circuits. It is applied in the manufacturing and quality control of leadframes for DIP-type ICs, ensuring compatibility with automated assembly processes and reliability in electronic devices. The standard is primarily used by semiconductor packaging factories and procurement teams to verify product specifications and performance.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.