GB/T 5594.8-2015

Active

Test methods for properties of structure ceramic used in electronic components and device—Part 8: Test method for microstructure

电子元器件结构陶瓷材料性能测试方法 第8部分:显微结构的测定方法

Standard Type
GBT
ICS
31
CCS
L90
Status
Active
Issue Date
2015-05-15
Implementation
2016-01-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the test method for determining the microstructure of structural ceramics used in electronic components and devices. It is applied in the quality control and material evaluation of ceramic substrates, packages, and insulators within the electronics industry, particularly for assessing grain size, porosity, and phase distribution. The method is essential for ensuring the reliability and performance of ceramic materials in high-frequency, high-voltage, or high-temperature electronic applications.

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.