GB/T 46821-2025

Active

Test methods for device embedded substrate

嵌入式基板测试方法

Standard Type
GBT
ICS
31.180
CCS
L30
Status
Active
Issue Date
2025-12-31
Implementation
2026-04-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
国家市场监督管理总局、国家标准化管理委员会

Application Summary AI generated

This standard specifies the test methods for evaluating the performance and reliability of device-embedded substrates, which are printed circuit boards with integrated passive or active components. It is applied in the electronics manufacturing industry, particularly for quality assurance and design validation of high-density interconnect substrates used in smartphones, automotive electronics, and IoT devices. The standard covers electrical, thermal, and mechanical tests to ensure the embedded devices function correctly under operational and environmental stress conditions.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.