GB/T 45723-2025

Active

Test method for printed board—Monitoring of single plated-through hole(PTH) resistance change during temperature cycling

印制电路板测试方法 温度循环状态下镀覆孔单孔电阻的变化

Standard Type
GBT
ICS
31.180
CCS
L30
Status
Active
Issue Date
2025-05-30
Implementation
2025-12-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
国家市场监督管理总局、国家标准化管理委员会

Application Summary AI generated

This standard specifies a test method for monitoring the resistance change of a single plated-through hole (PTH) in a printed circuit board (PCB) during temperature cycling. It is applied in the electronics industry to evaluate the reliability and structural integrity of PTHs under thermal stress, particularly for PCBs used in automotive, aerospace, and telecommunications equipment. The method helps detect potential failures like barrel cracking or interface separation by measuring resistance shifts across repeated temperature cycles.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.