GB/T 42706.2-2023
ActiveElectronic components—Long-term storage of electronic semiconductor devices—Part 2:Deterioration mechanisms
电子元器件 半导体器件长期贮存 第2部分:退化机理
Application Summary AI generated
This standard specifies the deterioration mechanisms affecting electronic semiconductor devices during long-term storage, including material aging, corrosion, and internal structural changes. It is applied in industries such as aerospace, defense, and industrial electronics where components may be stored for extended periods before deployment. The standard guides engineers and procurement professionals in assessing storage risks and implementing preventive measures to ensure device reliability.
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