GB/T 42706.2-2023

Active

Electronic components—Long-term storage of electronic semiconductor devices—Part 2:Deterioration mechanisms

电子元器件 半导体器件长期贮存 第2部分:退化机理

Standard Type
GBT
ICS
31.020
CCS
L40
Status
Active
Issue Date
2023-05-23
Implementation
2023-09-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
国家市场监督管理总局、国家标准化管理委员会

Application Summary AI generated

This standard specifies the deterioration mechanisms affecting electronic semiconductor devices during long-term storage, including material aging, corrosion, and internal structural changes. It is applied in industries such as aerospace, defense, and industrial electronics where components may be stored for extended periods before deployment. The standard guides engineers and procurement professionals in assessing storage risks and implementing preventive measures to ensure device reliability.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.