GB/T 16822-1997
ActiveTest method for dielectric properties of dielectric crystal
介电晶体介电性能的试验方法
Application Summary AI generated
This standard specifies the test methods for measuring the dielectric constant and dielectric loss of dielectric crystals. It is applied in the electronics industry for quality control and material characterization of crystalline components used in capacitors, oscillators, and microwave devices. The testing context involves precise measurement under controlled temperature and frequency conditions to ensure performance reliability.
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