GB/T 32988-2016
ActiveSynthetic quartz crystal wafer for optical low pass filter (OLPF)
人造石英光学低通滤波器晶片
Application Summary AI generated
This standard specifies the technical requirements, test methods, inspection rules, and packaging for synthetic quartz crystal wafers used in optical low pass filters (OLPF). It is applied in the manufacturing of digital cameras, camcorders, and other imaging devices where the wafer is placed in front of the image sensor to reduce moiré patterns and false color artifacts. The standard ensures consistent optical quality and dimensional precision for these wafers in the electronics and optical components industry.
Related Standards
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GB/T 12865-1997
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GB/T 12864-1997
Piezoelectric ceramic filters for use in electronic equipment--A specification in the quality assessment system for electronic components--Part 2:Sectional specification--Qualification approval
GB/T 15288-1994
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GB/T 15287-1994
Complete filter units for radio interference suppression--Part 1:Generic specification
GB/T 7343-1987
Methods of measurement of the suppresion characteristics of passive radio interference filters and suppression components over the frequency range of 10kHz to 30MHz
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