GB/T 32988-2016

Active

Synthetic quartz crystal wafer for optical low pass filter (OLPF)

人造石英光学低通滤波器晶片

Standard Type
GBT
ICS
31.160
CCS
L21
Status
Active
Issue Date
2016-10-13
Implementation
2017-09-01
Centralized Committee
中国建筑材料联合会
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the technical requirements, test methods, inspection rules, and packaging for synthetic quartz crystal wafers used in optical low pass filters (OLPF). It is applied in the manufacturing of digital cameras, camcorders, and other imaging devices where the wafer is placed in front of the image sensor to reduce moiré patterns and false color artifacts. The standard ensures consistent optical quality and dimensional precision for these wafers in the electronics and optical components industry.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.