Browse Standards

1435+ standards in database

1435 result(s) found

GB/T 15651.2-2003 Active

半导体分立器件和集成电路 第5-2部分:光电子器件 基本额定值和特性

Discrete semiconductor devices and integrated circuits--Part 5-2:Optoelectronic devices--Essential ratings and characteristics

ICS: 31.260
2004-08-01
GB/T 12747.1-2004 Abolished

标称电压1 kV及以下交流电力系统用自愈式并联电容器 第1部分:总则----性能、试验和定额----安全要求----安装和运行导则

Shunt power capacitors of the self-healing type for a.c. systems having a rated valtage up to and including 1000V--Part 1:General--Performance,testing and rating--Safety requirements--Guide for installation and operation

ICS: 31.060.70
2004-08-01
GB/T 3984.1-2004 Active

感应加热装置用电力电容器 第1部分:总则

Power capacitors for inductionheating installations--Part 1:General

ICS: 31.060.70
2004-08-01
GB/T 8446.1-2004 Abolished

电力半导体器件用散热器 第1部分:铸造类系列

Heat sink for power semiconductor device--Part 1:Casting kind series

ICS: 31.080
2004-08-01
GB/T 8446.2-2004 Abolished

电力半导体器件用散热器 第2部分:热阻和流阻测试方法

Heat sink for power semiconductor device--Part 2:Measuring method of thermal resistance and inputfluid-output fluid pressure difference

ICS: 31.080
2004-08-01
GB/T 8446.3-2004 Abolished

电力半导体器件用散热器 第3部分:绝缘件和紧固件

Heat sink for power semiconductor device--Part 3:Insulators and fasteners

ICS: 31.080
2004-08-01
GB/T 12747.2-2004 Abolished

标称电压1 kV及以下交流电力系统用自愈式并联电容器 第2部分:老化试验、自愈性试验和破坏试验

Shunt power capacitors of the self-healing type for a.c.systems having a rated voltage up to and including 1000V--Part 2:Ageing test,self-healing test and destruction test

ICS: 31.060.70
2004-08-01
GB/T 3984.2-2004 Active

感应加热装置用电力电容器 第2部分:老化试验、破坏试验和内部熔丝隔离要求

Power capacitors for induction heating installations--Part 2:Ageing test,destruction test and requirements for disconnecting internal fuses

ICS: 31.060.70
2004-08-01
GB/T 18496.2-2005 Active

电子设备用机电开关 第4-1部分:钮子(倒扳)开关 空白详细规范

Electromechanical switches for use in electronic equipment Part 4-1:Sectional specification for lever(toggle)switches Blank detail specification

ICS: 31.220.20
2005-08-01
GB/T 13150-2005 Active

半导体器件 分立器件 电流大于 100A、环境和管壳额定的双向三极晶闸管空白详细规范

Semiconductor devices Discret devices Blank detail specification for bidirectional triode thyristors(triacs),ambient and case-rated,for currents greater than 100A

ICS: 31.080.20
2005-10-01
GB/T 13151-2005 Active

半导体器件 分立器件 第6部分:晶闸管 第3篇 电流大于 100A、环境和管壳额定的反向阻断三极晶闸管空白详细规范

Semiconductor devices Discrete devices Part 6:Thyristors Section Three-Blank detail specification for reverse blocking triode thyristors,ambient and case-rated,for currents greater than 100A

ICS: 31.080.20
2005-10-01
GB/Z 18462-2001 Abolished

激光加工机械 金属切割的性能规范与标准检查程序

Laser processing machines--Performance specifications and benchmarks for cutting of metals

ICS: 31.260
GB/Z 43510-2023 Active

集成电路TSV三维封装可靠性试验方法指南

Integrated circuit TSV 3D package reliability test methods guideline

ICS: 31.200
GB/Z 107-2025 Active

半导体器件 基于扫描的半导体器件退化水平评估

Semiconductor devices—Scan based ageing level estimation for semiconductor devices

ICS: 31.080.01
GB/Z 102.17-2026 Active

半导体器件 分立器件 第17部分:基本绝缘和加强绝缘的磁耦合器和电容耦合器

Semiconductor devices—Discrete devices—Part 17: Magnetic and capacitive coupler for basic and reinforced insulation

ICS: 31.080.99
GB/T 19248-2003 Active

封装引线电阻测试方法

Test method for measuring the resistance of package leads

ICS: 31.200
2003-10-01
GB/T 19183.1-2003 Abolished

电子设备机械结构 户外机壳 第1部分:设计导则

Mechanical structures for electronic equipment--Outdoor enclosures--Part 1: Design guidelines

ICS: 31.240
2004-01-01
GB/T 7267-2003 Abolished

电力系统二次回路控制、保护屏及柜基本尺寸系列

Series of basic dimensionof control and protective panels and cabinet for secondary circuit of power system

ICS: 31.240
2003-12-01
GB/T 19183.4-2003 Abolished

电子设备机械结构 户外机壳 第2-2部分: 箱体尺寸

Mechanical structuresfor electronic equipment--Outdoor enclosures--Part 2-2: Dimensions for cases

ICS: 31.240
2004-01-01
GB/T 19183.3-2003 Abolished

电子设备机械结构 户外机壳 第2-1部分:机柜尺寸

Mechanical structuresfor electronic equipment--Outdoor enclosures--Part 2-1:Dimensions for cabinets

ICS: 31.240
2004-01-01
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