GB/Z 107-2025

This standard specifies a methodology for estimating the ageing level of semiconductor devices using scan-based testing techniques, such as scan chains commonly found in digital integrated circuits. It is applied in the reliability assessment and predictive maintenance of semiconductor components, particularly for complex chips used in automotive, aerospace, and industrial electronics where long-term operational stability is critical. The standard provides a framework for evaluating degradation without requiring physical access to internal nodes, enabling non-invasive health monitoring during production testing or field operation.