GB/Z 46984.4-2026
ActivePhotovoltaic cells—Part 4: Measurement of light and elevated temperature induced degradation of crystalline silicon photovoltaic cells
光伏电池 第4部分：晶体硅光伏电池光热诱导衰减试验方法
Application Summary AI generated
This standard specifies the test method for measuring light and elevated temperature induced degradation (LeTID) in crystalline silicon photovoltaic cells. It is applied in the solar energy industry to evaluate the long-term reliability and performance stability of silicon cells under combined light and thermal stress. The standard is used by manufacturers and testing laboratories during product qualification and quality control to ensure cells meet durability requirements for field deployment.
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