GB/Z 119-2026
ActiveC-Si photovoltaic(PV) modules—Light and elevated temperature induced degradation (LETID) test—Detection
晶体硅光伏组件 光热诱导衰减（LETID）试验 检测
Application Summary AI generated
This standard specifies the test method for detecting Light and Elevated Temperature Induced Degradation (LETID) in crystalline silicon photovoltaic (PV) modules. It is applied in the solar energy industry for quality assurance and reliability testing of PV modules, particularly to assess performance losses under combined light and high-temperature stress conditions. The standard is used by manufacturers, testing laboratories, and certification bodies to evaluate module durability and ensure long-term power output stability in field installations.
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