GB/Z 117.101-2026
ActivePhotovoltaic modules—Test methods for the detection of potential-induced degradation—Part 1-1: Crystalline silicon—Delamination
光伏组件 电势诱导衰减测试方法 第1-1部分：晶体硅组件 分层
Application Summary AI generated
This standard specifies test methods for detecting potential-induced degradation (PID) specifically related to delamination in crystalline silicon photovoltaic modules. It is applied in the solar energy industry for quality assurance and reliability testing of PV modules under high-voltage stress conditions, particularly in large-scale solar power plants and rooftop installations. The standard helps manufacturers and testing laboratories evaluate module durability against PID-related delamination, ensuring long-term performance and safety in field operation.
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