GB/Z 129-2026
ActiveSurface chemical analysis—Electron spectroscopies—Measurement of the thickness and composition of nanoparticle coatings
表面化学分析 电子能谱 纳米颗粒包覆层厚度和组成的测量
Application Summary AI generated
This standard specifies methods using electron spectroscopies, such as X-ray photoelectron spectroscopy (XPS) or Auger electron spectroscopy (AES), to measure the thickness and elemental composition of coatings on nanoparticles. It is applied in materials science and nanotechnology industries for quality control and research, particularly when characterizing core-shell nanoparticles, quantum dots, or functionalized nanomaterials where precise coating properties affect performance.
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