GB/T 9247-2008
ActiveMicroscopes-Condensers
显微镜 聚光镜
Catalogue
前言 → 1 范围 → 2 规范性引用文件 → 3 分类及基本参数 → 4 要求 → 附录A Foreword → 1 Scope → 2 Normative References → 3 Classification and Basic Parameters → 4 Requirements → Annex A
Scope
This standard specifies the classification, basic parameters, requirements, test methods, and marking of microscope condensers. This standard applies to upright microscope condensers for transmitted light observation.
本标准规定了显微镜聚光镜的分类及基本参数、要求、试验方法和标志。本标准适用于以透射光观察的正置式显微镜聚光镜。
Normative References
Keywords
Application Summary AI generated
Microscope manufacturers and quality inspection agencies use this standard to design and verify condenser performance parameters, ensuring that numerical aperture, diaphragm adjustment, and other specifications meet unified requirements. This standard is critical for ensuring microscope imaging quality and optical system compatibility.
显微镜制造商和质检机构使用本标准来设计和检验聚光镜的性能参数，确保聚光镜的数值孔径、光阑调节等指标符合统一要求。该标准对于保证显微镜成像质量和光学系统兼容性至关重要。
AI Summary AI generated
GB/T 9247-2008 'Microscopes-Condensers' specifies the classification, basic parameters, technical requirements, test methods, and marking of condensers for upright transmitted-light microscopes. The standard covers dry, oil-immersion, darkfield, and other condenser types, with clear requirements for numerical aperture, diaphragm, and mechanical precision. Compared to the 1996 version, it adds provisions for numerical aperture manufacturing deviation and corresponding measurement procedures, and improves stress inspection and appearance quality requirements. It applies to microscope manufacturing and inspection.
GB/T 9247-2008《显微镜 聚光镜》规定了正置式透射光显微镜聚光镜的分类、基本参数、技术要求、试验方法和标志。标准涵盖干式、油浸、暗场等多种聚光镜类型，对数值孔径、光阑、机械精度等提出明确要求。相比1996版，新增了数值孔径制造偏差规定及测量程序，并改进了应力检查和外观质量要求。适用于显微镜制造和检验领域。
Key Sentences extracted from text
本标准规定了显微镜聚光镜的分类及基本参数、要求、试验方法和标志。
前组摆动架多次装入聚光镜前组时，前组透镜轴线在聚光镜焦平面上偏移不应大于0.02 mm。
聚光镜轴线应与孔径光阑中心基本重合。
可变孔径光阑应呈圆形，转动灵活，最小孔径应小于φ2 mm。
本版本增加了对聚光镜数值孔径制造偏差的规定，并相应增加了聚光镜数值孔径的测量程序。
This standard specifies the classification, basic parameters, requirements, test methods, and marking of microscope condensers.
When the front group swing frame is repeatedly inserted into the condenser front group, the offset of the front group lens axis on the condenser focal plane shall not exceed 0.02 mm.
The condenser axis shall be substantially coincident with the center of the aperture diaphragm.
The variable aperture diaphragm shall be circular, rotate flexibly, and the minimum aperture shall be less than φ2 mm.
This version adds provisions for the manufacturing deviation of the numerical aperture of the condenser, and correspondingly adds the measurement procedure for the numerical aperture of the condenser.
Standard Timeline
Changes from replaced version:
- 增加了对聚光镜数值孔径制造偏差的规定，并相应增加了聚光镜数值孔径的测量程序
- 将1996年版本中试验所用的'专用显微镜架'改为'与被检聚光镜配用的显微镜架'
- 用于偏光显微镜的聚光镜应力检查改用应力检查仪检查
- 对聚光镜的外观质量及光学件的清洁要求均明确提出具体的质量要求
- Added provisions for the manufacturing deviation of the numerical aperture of the condenser, and correspondingly added the measurement procedure for the numerical aperture of the condenser
- Changed 'special microscope frame' used in tests in the 1996 version to 'microscope frame matched with the condenser under test'
- Changed the stress inspection of condensers for polarizing microscopes to use a stress inspection instrument
- Explicitly specified specific quality requirements for the appearance quality of the condenser and the cleanliness of optical components