GB/T 4937.9-2026
UpcomingSemiconductor devices—Mechanical and climatic test methods—Part 9：Permanence of marking
半导体器件 机械和气候试验方法 第9部分：标志耐久性
Application Summary AI generated
This standard specifies test methods for evaluating the permanence of markings on semiconductor devices, including integrated circuits and discrete components. It is applied in quality assurance and reliability testing to ensure that product labels, logos, and part numbers remain legible after exposure to mechanical abrasion, solvents, and climatic conditions. Manufacturers and testing laboratories use this standard to verify marking durability for compliance with industry specifications and procurement requirements.
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