GB/T 4937.42-2023
ActiveSemiconductor devices—Mechanical and climatic test methods—Part 42:Temperature and humidity storage
半导体器件 机械和气候试验方法 第42部分：温湿度贮存
Application Summary AI generated
This standard specifies the test method for subjecting semiconductor devices to combined temperature and humidity storage conditions. It is applied in the electronics industry to evaluate the long-term reliability and moisture resistance of components like integrated circuits and discrete semiconductors under non-operating, accelerated aging environments. The test is used for qualification, lot acceptance, and reliability monitoring of devices intended for consumer, industrial, or automotive applications.
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