GB/T 4937.38-2025
UpcomingSemiconductor devices—Mechanical and climatic test methods—Part 38: Soft error test method for semiconductor devices with memory
半导体器件 机械和气候试验方法 第38部分：带存储的半导体器件的软错误试验方法
Application Summary AI generated
This standard specifies the test method for evaluating the susceptibility of semiconductor devices with memory, such as SRAM, DRAM, and flash memory, to soft errors caused by ionizing radiation. It is applied in the aerospace, automotive, and high-reliability electronics industries to qualify components for use in environments with elevated radiation levels, such as at high altitudes or in space. The test method helps manufacturers and engineers assess device robustness against single-event upsets (SEUs) during design validation and quality assurance.
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