GB/T 4937.36-2025
UpcomingSemiconductor devices—Mechanical and climatic test methods—Part 36:Acceleration，steady state
半导体器件 机械和气候试验方法 第36部分：稳态加速度
Application Summary AI generated
This standard specifies the test method for determining the ability of semiconductor devices to withstand steady-state acceleration forces, simulating conditions such as rocket launch or high-speed rotation. It is applied in the aerospace, automotive, and military electronics industries to qualify components like integrated circuits and diodes for use in environments with sustained high g-forces. The test ensures mechanical integrity and electrical functionality under constant acceleration, typically using a centrifuge to apply specified stress levels.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.