GB/T 4937.28-2026
UpcomingSemiconductor devices—Mechanical and climate test methods—Part 28: Electrostatic discharge (ESD) sensitivity testing—Charged device model (CDM)—device level
半导体器件 机械和气候试验方法 第28部分：静电放电（ESD）敏感度测试 带电器件模型（CDM） 器件级
Application Summary AI generated
This standard specifies the test method for evaluating the electrostatic discharge (ESD) sensitivity of semiconductor devices using the Charged Device Model (CDM) at the device level. It is applied in the electronics industry to simulate real-world ESD events where a charged device discharges through a pin to ground, ensuring reliability in manufacturing, handling, and assembly processes. The standard is critical for quality control and failure analysis of integrated circuits, transistors, and other discrete semiconductor components.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.