GB/T 4937.27-2023
ActiveSemiconductor devices—Mechanical and climatic test methods—Part 27: Electrostatic discharge(ESD) sensitivity testing—Machine model(MM)
半导体器件 机械和气候试验方法 第27部分：静电放电（ESD）敏感度测试 机器模型（MM）
Application Summary AI generated
This standard specifies the machine model (MM) test method for evaluating the electrostatic discharge (ESD) sensitivity of semiconductor devices. It is applied in the electronics industry to simulate ESD events from charged machinery or equipment during manufacturing, assembly, and handling. The standard ensures device reliability by defining test procedures, stress levels, and failure criteria for quality control and procurement specifications.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.