GB/T 4937.26-2023
ActiveSemiconductor devices—Mechanical and climatic test methods—Part 26: Electrostatic discharge (ESD) sensitivity testing—Human body model（HBM）
半导体器件 机械和气候试验方法 第26部分：静电放电（ESD）敏感度测试 人体模型（HBM）
Application Summary AI generated
This standard specifies the test method for evaluating the electrostatic discharge (ESD) sensitivity of semiconductor devices using the Human Body Model (HBM). It is applied in the electronics industry to simulate the discharge that occurs when a charged human touches a device, ensuring components can withstand typical handling scenarios during manufacturing and assembly. The standard is used for qualification, reliability testing, and quality control of integrated circuits and discrete semiconductors.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.