GB/T 4937.23-2023

Active

Semiconductor devices—Mechanical and climatic test methods—Part 23:High temperature operating life

半导体器件 机械和气候试验方法 第23部分：高温工作寿命

Standard Type
GBT
ICS
31.080.01
CCS
L40
Status
Active
Issue Date
2023-05-23
Implementation
2023-12-01
Centralized Committee
工业和信息化部（电子）
Issuing Authority
国家市场监督管理总局、国家标准化管理委员会

Application Summary AI generated

This standard specifies the high temperature operating life (HTOL) test method for semiconductor devices, used to evaluate their reliability under accelerated thermal and electrical stress. It is applied in the electronics industry for qualification and lot acceptance testing of integrated circuits, transistors, and diodes, particularly for automotive, industrial, and consumer applications. The test simulates long-term operation at elevated junction temperatures to identify early failures and assess long-term failure mechanisms.

Related Standards

GB/T 8446.3-2004 Heat sink for power semiconductor device--Part 3:Insulators and fasteners GB/T 8446.2-2004 Heat sink for power semiconductor device--Part 2:Measuring method of thermal resistance and inputfluid-output fluid pressure difference GB/T 8446.1-2004 Heat sink for power semiconductor device--Part 1:Casting kind series GB/T 13151-2005 Semiconductor devices Discrete devices Part 6:Thyristors Section Three-Blank detail specification for reverse blocking triode thyristors,ambient and case-rated,for currents greater than 100A GB/T 13150-2005 Semiconductor devices Discret devices Blank detail specification for bidirectional triode thyristors(triacs),ambient and case-rated,for currents greater than 100A GB/Z 107-2025 Semiconductor devices—Scan based ageing level estimation for semiconductor devices GB/Z 102.17-2026 Semiconductor devices—Discrete devices—Part 17: Magnetic and capacitive coupler for basic and reinforced insulation GB/T 6589-2002 Semiconductordevices--Discrete devices--Part 3-2:Signal (including switching) and regulator diodes--Blank detail specification for voltage-regulator diodes and voltage-reference diodes (excluding temperature-compensated precision reference diodes)
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.