GB/T 4937.18-2018
ActiveSemiconductor devices—Mechanical and climatic test methods—Part 18: Ionizing radiation (total dose)
半导体器件 机械和气候试验方法 第18部分：电离辐射(总剂量)
Application Summary AI generated
This standard specifies the test method for evaluating the total ionizing dose (TID) effects of radiation on semiconductor devices. It is applied in the aerospace, nuclear, and high-energy physics industries to qualify components for use in radiation-prone environments. The test ensures device reliability by measuring performance degradation under controlled gamma or X-ray exposure.
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