GB/T 4937.17-2018
ActiveSemiconductor devices—Mechanical and climatic test methods—Part 17: Neutron irradiation
半导体器件 机械和气候试验方法 第17部分：中子辐照
Application Summary AI generated
This standard specifies the neutron irradiation test methods for semiconductor devices, defining procedures to evaluate their performance and survivability under neutron radiation exposure. It is applied in the aerospace, nuclear energy, and defense industries, where components must withstand high-energy neutron environments, such as in satellite electronics or reactor control systems. The standard ensures reliability testing for devices used in radiation-prone contexts, including particle accelerators and military equipment.
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