GB/T 4937.13-2018

Active

Semiconductor devices—Mechanical and climatic test methods—Part 13: Salt atmosphere

半导体器件 机械和气候试验方法 第13部分：盐雾

Standard Type
GBT
ICS
31.080.01
CCS
L40
Status
Active
Issue Date
2018-09-17
Implementation
2019-01-01
Centralized Committee
工业和信息化部（电子）
Issuing Authority
国家市场监督管理总局、中国国家标准化管理委员会

Application Summary AI generated

GB/T 4937.13-2018 specifies the salt atmosphere test method for evaluating the corrosion resistance of semiconductor devices under saline environmental conditions. It is applied in the electronics industry to assess the reliability and durability of components such as integrated circuits and discrete semiconductors, particularly for products intended for marine, coastal, or high-humidity applications. This standard is used during qualification testing and quality assurance to ensure devices can withstand corrosive salt-laden atmospheres without performance degradation.

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.