GB/T 4937.1-2006

Active

Semiconductor devices―Mechanical and climatic test methods―Part 1: General

半导体器件 机械和气候试验方法 第1部分: 总则

Standard Type
GBT
ICS
31.080.01
CCS
L40
Status
Active
Issue Date
2006-08-23
Implementation
2007-02-01
Centralized Committee
工业和信息化部（电子）
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

GB/T 4937.1-2006 specifies the general principles, definitions, and common requirements for mechanical and climatic testing of semiconductor devices. It is applied in the electronics industry to establish uniform test conditions, such as temperature cycling, vibration, and humidity exposure, for evaluating the reliability and durability of discrete semiconductors and integrated circuits. This standard serves as the foundational framework for subsequent parts detailing specific test methods used in quality assurance and product qualification.

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.