GB/T 46984.1-2025
ActivePhotovoltaic cells—Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
光伏电池 第1部分：晶体硅光伏电池光致衰减试验方法
Application Summary AI generated
This standard specifies the test method for measuring light-induced degradation (LID) in crystalline silicon photovoltaic cells. It is applied in the manufacturing and quality control of solar cells to evaluate performance loss under controlled illumination conditions. The standard ensures consistent testing protocols for cell efficiency and reliability in the photovoltaic industry.
Related Standards
NY/T 759-2003
Specification for pressure-resistant domestic solar water heater
NY/T 1146.1-2006
Solar energy PV generation system for household Part 1: Technical condition
GB/T 19393-2003
Rating of direct coupled photovoltaic(PV)--Pumping systems
GB/T 19394-2003
UV test for photovoltaic(PV)modules
GB/Z 40104.103-2023
Solar thermal electric plants—Part 1-3: General—Data format for meteorological data sets
GB/Z 45115-2024
Solar thermal electric plants—Characterization of active, sensible systems for direct and indirect configurations
GB/Z 46984.4-2026
Photovoltaic cells—Part 4: Measurement of light and elevated temperature induced degradation of crystalline silicon photovoltaic cells
GB/Z 117.101-2026
Photovoltaic modules—Test methods for the detection of potential-induced degradation—Part 1-1: Crystalline silicon—Delamination
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.