GB/T 4589.1-2006

Active

Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

半导体器件 第10部分:分立器件和集成电路总规范

Standard Type
GBT
ICS
31.080.01
CCS
L40
Status
Active
Issue Date
2006-10-10
Implementation
2007-02-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
工业和信息化部(电子)

Application Summary AI generated

This standard specifies the general quality assessment procedures, test methods, and reliability requirements for discrete semiconductor devices and integrated circuits. It is applied in the manufacturing, procurement, and quality inspection of electronic components across industries such as consumer electronics, telecommunications, and automotive systems. The standard ensures consistent performance and interchangeability of semiconductor devices used in both domestic and international markets.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.