GB/T 40066-2021
ActiveNanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
纳米技术 氧化石墨烯厚度测量 原子力显微镜法
Application Summary AI generated
This standard specifies the method for measuring the thickness of graphene oxide flakes using Atomic Force Microscopy (AFM). It is applied in nanotechnology research and quality control for characterizing two-dimensional materials, particularly in laboratories and industries producing or utilizing graphene oxide for electronics, coatings, or composites. The standard ensures consistent and reliable thickness data, which is critical for material performance and downstream application development.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.