GB/Z 21738-2008

Active

Fundamental structures of one dimensional nanomaterials - High resolution electron microscopy characterization

一维纳米材料的基本结构 高分辨透射电子显微镜检测方法

Standard Type
GBZ
ICS
17.180.01
CCS
N30
Status
Active
Issue Date
2008-05-08
Implementation
N/A
Centralized Committee
中国科学院
Issuing Authority
国家市场监督管理总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the high-resolution transmission electron microscopy (HRTEM) method for characterizing the fundamental structures of one-dimensional nanomaterials, such as nanowires, nanotubes, and nanorods. It is applied in research and quality control within nanotechnology and materials science to determine parameters like lattice spacing, crystal orientation, and defect structures at the atomic scale. The standard ensures consistent and reliable structural analysis for product development and performance evaluation in industries like electronics, energy, and advanced manufacturing.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.