GB/T 19500-2004
AbolishedGeneral rules for X-ray photoelectron spectroscopic analysis method
X-射线光电子能谱分析方法通则
Application Summary AI generated
This standard specifies the general principles, instrumentation requirements, sample preparation, and data processing procedures for X-ray photoelectron spectroscopy (XPS) analysis. It is applied in materials science, surface chemistry, and semiconductor industries for characterizing elemental composition and chemical states on solid surfaces, particularly in quality control and failure analysis of thin films, coatings, and catalysts.
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