GB/T 38532-2020

Active

Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size

微束分析 电子背散射衍射 平均晶粒尺寸的测定

Standard Type
GBT
ICS
71.040.40
CCS
G04
Status
Active
Issue Date
2020-03-06
Implementation
2021-02-01
Centralized Committee
国家标准委
Issuing Authority
国家标准委

Application Summary AI generated

This standard specifies the method for measuring average grain size in crystalline materials using electron backscatter diffraction (EBSD) in a scanning electron microscope. It is applied in materials science and engineering for quality control and research on metals, ceramics, and other polycrystalline samples. The standard ensures consistent and comparable grain size data across laboratories, particularly in industries like metallurgy, aerospace, and semiconductor manufacturing.

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.