GB/T 38532-2020
ActiveMicrobeam analysis—Electron backscatter diffraction—Measurement of average grain size
微束分析 电子背散射衍射 平均晶粒尺寸的测定
Application Summary AI generated
This standard specifies the method for measuring average grain size in crystalline materials using electron backscatter diffraction (EBSD) in a scanning electron microscope. It is applied in materials science and engineering for quality control and research on metals, ceramics, and other polycrystalline samples. The standard ensures consistent and comparable grain size data across laboratories, particularly in industries like metallurgy, aerospace, and semiconductor manufacturing.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.