GB/T 37983-2019
ActiveTesting methods of X-ray diffraction for determining the orientation of crystal materials by rotation
晶体材料X射线衍射仪旋转定向测试方法
Application Summary AI generated
This standard specifies the test method for determining the crystallographic orientation of single crystal materials using X-ray diffraction with a rotation technique. It is applied in the semiconductor, optical crystal, and piezoelectric material industries for quality control and processing alignment of wafers, ingots, and other crystalline components. The method is used in laboratory and production testing contexts to ensure precise orientation for subsequent cutting, polishing, or device fabrication.
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