GB/T 37254-2018
ActiveHigh purity silicon carbide—Determination of trace elements
高纯碳化硅 微量元素的测定
Application Summary AI generated
This standard specifies analytical methods for determining trace element concentrations in high-purity silicon carbide (SiC) powder. It is applied in the semiconductor and advanced ceramics industries to ensure raw material purity for manufacturing power electronic devices, LED substrates, and high-temperature structural components. The testing context involves quality control laboratories verifying compliance with purity specifications during production and procurement.
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