GB/T 36655-2018
ActiveTest method for alpha crystalline silicon dioxide content of spherical silica powder for electronic packaging—XRD method
电子封装用球形二氧化硅微粉中α态晶体二氧化硅含量的测试方法 XRD法
Application Summary AI generated
This standard specifies an X-ray diffraction (XRD) method for determining the alpha crystalline silicon dioxide content in spherical silica powder used for electronic packaging. It is applied in the semiconductor and electronics industry to ensure the purity and thermal stability of silica fillers in epoxy molding compounds, underfill materials, and other packaging substrates. The test is critical for quality control in manufacturing processes where excessive alpha-phase quartz can cause thermal expansion mismatches and reliability issues in packaged devices.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.