GB/T 36401-2018
ActiveSurface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
表面化学分析 X射线光电子能谱 薄膜分析结果的报告
Application Summary AI generated
This standard specifies the requirements for reporting results from X-ray photoelectron spectroscopy (XPS) analysis of thin films, including data on elemental composition, chemical states, and depth distribution. It is applied in materials science, semiconductor manufacturing, and surface engineering industries to ensure consistent and comparable documentation of thin-film characterization. The standard is used by analytical laboratories and quality control teams when generating reports for research, product development, or failure analysis.
Related Standards
GB/T 20724-2006
Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 28727-2012
Gas analysis - Determination of sulfides - Gas chromatograph with flame photometric detector
GB/T 14666-2003
Terms for analytical chemistry
GB/T 674-2003
Chemical reagent--Copper(II)oxide powder
GB/T 1265-2003
Chemical reagent--Sodium bromide
GB/T 656-2003
Chemical reagent--Ammonium dichromate
GB/T 606-2003
Chemical reagent--General method for the determination of water--Karl Fischer method
GB/T 19502-2004
Surface chemical analysis--Glowdischarge optical emission spectrometry(GD-OES)--Introduction to use
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.