GB/T 34831-2017
ActiveNanotechnologies—Electron microscopy imaging of noble metal nanoparticles—High angle annular dark field imaging method
纳米技术 贵金属纳米颗粒电子显微镜成像 高角环形暗场法
Application Summary AI generated
This standard specifies the use of high-angle annular dark-field (HAADF) imaging in scanning transmission electron microscopy (STEM) for characterizing noble metal nanoparticles, such as gold or silver. It is applied in nanotechnology research and quality control to accurately measure particle size, morphology, and distribution, particularly in fields like catalysis, biomedicine, and electronics. The method ensures reliable, high-contrast imaging for nanoparticles below 100 nm, where conventional bright-field imaging may lack sufficient resolution.
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