GB/T 34172-2017

Active

Microbeam analysis—Electron backscatter diffraction—Phase analysis method of metal and alloy

微束分析 电子背散射衍射 金属及合金的相分析方法

Standard Type
GBT
ICS
71.040.40
CCS
G04
Status
Active
Issue Date
2017-09-07
Implementation
2018-08-01
Centralized Committee
国家标准委
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the method for performing phase analysis on metals and alloys using electron backscatter diffraction (EBSD) in a scanning electron microscope. It is applied in materials science and engineering for identifying and quantifying crystalline phases, determining phase distributions, and analyzing grain orientations in metallic samples. The standard is used in quality control, failure analysis, and research contexts where precise microstructural characterization of metals and alloys is required.

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.