GB/T 34002-2017
ActiveMicrobeam analysis—Analytical transmission electron microscopy—Methods for calibrating image magnification by using reference materials having periodic structures
微束分析 透射电子显微术 用周期结构标准物质校准图像放大倍率的方法
Application Summary AI generated
This standard specifies methods for calibrating the magnification of images in analytical transmission electron microscopy (TEM) using reference materials with periodic structures, such as diffraction grating replicas or crystalline lattices. It is applied in chemical analysis and materials science laboratories to ensure accurate dimensional measurements of micro- and nanostructures. The standard is critical for quality control in semiconductor manufacturing, nanotechnology research, and failure analysis where precise TEM image scaling is required.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.