GB/T 33838-2017

Active

Microbeam analysis—Scanning electron microscopy—Methods of evaluating image sharpness

微束分析 扫描电子显微术 图像锐度评估方法

Standard Type
GBT
ICS
71.040.40
CCS
G04
Status
Active
Issue Date
2017-05-31
Implementation
2018-04-01
Centralized Committee
国家标准委
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies methods for evaluating the sharpness of images obtained from scanning electron microscopes (SEM). It is applied in microbeam analysis and chemical testing laboratories to ensure consistent image quality for materials characterization, failure analysis, and quality control in industries such as semiconductor manufacturing, metallurgy, and nanotechnology.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.